VACUUM-ULTRAVIOLET CHARACTERIZATION OF SAPPHIRE, ALON, AND SPINEL NEAR THE BAND-GAP

Citation
Me. Thomas et al., VACUUM-ULTRAVIOLET CHARACTERIZATION OF SAPPHIRE, ALON, AND SPINEL NEAR THE BAND-GAP, Optical engineering, 32(6), 1993, pp. 1340-1343
Citations number
12
Categorie Soggetti
Optics
Journal title
ISSN journal
00913286
Volume
32
Issue
6
Year of publication
1993
Pages
1340 - 1343
Database
ISI
SICI code
0091-3286(1993)32:6<1340:VCOSAA>2.0.ZU;2-V
Abstract
Ultraviolet optical properties near the edge of transparency (just abo ve and below the band gap) of polycrystalline ALON (aluminum oxynitrid e, Al23O27N5) and spinel are not well characterized. The edge of trans parency is commonly found to obey Urbach's rule, and this is the case for single-crystal sapphire and polycrystalline ALON and spinel as wel l. Room-temperature transmission and reflection measurements are made from 2500 to 1150 angstrom on these materials and the corresponding ab sorption coefficient at the band gap is represented by Urbach's rule.