HIGH-RESOLUTION ELECTRON-MICROSCOPY ON SUPERCONDUCTING YBA2CU3O7 THIN-FILMS

Authors
TRAEHOLT C WEN JG SVETCHNIKOV V DELSING A ZANDBERGEN HW
Citation
C. Traeholt et al., HIGH-RESOLUTION ELECTRON-MICROSCOPY ON SUPERCONDUCTING YBA2CU3O7 THIN-FILMS, Thin solid films, 228(1-2), 1993, pp. 178-181
Citations number
5
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
Thin solid films → ACNP
ISSN journal
00406090
Volume
228
Issue
1-2
Year of publication
1993
Pages
178 - 181
Database
ISI
SICI code
0040-6090(1993)228:1-2<178:HEOSYT>2.0.ZU;2-Y
Abstract
Several examples of the use of high resolution electron microscopy for the characterization of the microstructure of thin films of YBa2Cu3O7 are given. It is argued that the sample preparation (cross-section pr eparation) is a very crucial part of the high T(C) superconducting fil ms as well as the interpretation of the high resolution images. Exampl es are shown of a Josephson junction on yttria-stabilized ZrO2, YBa2Cu 3O7 on MgO, a La2CuO4-YBa2Cu3O7-La2CuO4 multilayer and the effect of t he electron beam on the interface of a YBa2Cu3O7-SrTiO3 interface.