To promote lacquer adhesion, different thin films of tin oxides have b
een grown by means of electrochemical treatments on low tin-plated fer
ritic steels. The chemical composition and semiconducting properties o
f the oxide films have been studied by means of the combined use of X-
ray photoelectron spectroscopy (XPS) and electrochemical analytical te
chniques. These materials were coated with an epoxy-phenolic lacquer a
nd subjected to wet lacquer adhesion tests. Along with these adhesion
measurements, XPS and electrochemical results show that the lacquer ad
hesion is enhanced when there is an increase in the extent of p-type s
emiconduction and when the oxide film thickness is a few nanometres th
ick.