OPTICAL SPECTROSCOPY OF FIELD-INDUCED CHARGE IN POLY(2,5-DIMETHOXY-P-PHENYLENE VINYLENE) METAL-INSULATOR-SEMICONDUCTOR STRUCTURES

Citation
Mg. Harrison et al., OPTICAL SPECTROSCOPY OF FIELD-INDUCED CHARGE IN POLY(2,5-DIMETHOXY-P-PHENYLENE VINYLENE) METAL-INSULATOR-SEMICONDUCTOR STRUCTURES, Synthetic metals, 55(1), 1993, pp. 218-223
Citations number
7
Categorie Soggetti
Physics, Condensed Matter","Metallurgy & Mining
Journal title
ISSN journal
03796779
Volume
55
Issue
1
Year of publication
1993
Pages
218 - 223
Database
ISI
SICI code
0379-6779(1993)55:1<218:OSOFCI>2.0.ZU;2-E
Abstract
We have investigated metal-insulator-semiconductor structures fabricat ed with poly(2,5-dimethoxy-p-phenylene vinylene) as the active semicon ductor. In accumulation, we have observed three charge-related absorpt ion features at 0.7eV, 1.7eV and 2.0eV which scale in intensity with t he field-induced charge present in the device accumulation layer. We n ote that the two lower transitions are due to the same state, which ca n be associated with the presence of long-lived bipolarons, observed i n photo-induced absorption. We estimate a value for the optical cross- section associated with the bipolaron absorption at 0.7eV, of around 2 x 10(-15)cm2.