We report the results obtained from electrical measurements and surfac
e analysis by photoelectron spectroscopy (XPS) performed in polyparaph
enylene-vinylene (PPV) thin films sandwiched between metallic electrod
es. Current-voltage characteristics of metal-polymer-metal devices are
dissymetrical with rectifying contacts at top electrodes (Cr or Al) a
nd blocking one at bottom electrodes (Cr). Analysis of the core level
spectra of carbon, oxygen and metals in the interfacial layers leads t
o the conclusion that the rectifying behaviour of polymer-metal contac
t is in close relation with the formation of metallic oxide-carbon com
plexes at the interfaces.