PHOTOELECTRON AND ION-SCATTERING SPECTROSCOPY OF ZEOLITES UNDER REDUCED SURFACE-CHARGE CONDITIONS

Citation
W. Grunert et al., PHOTOELECTRON AND ION-SCATTERING SPECTROSCOPY OF ZEOLITES UNDER REDUCED SURFACE-CHARGE CONDITIONS, Surface and interface analysis, 20(7), 1993, pp. 603-606
Citations number
12
Categorie Soggetti
Chemistry Physical
ISSN journal
01422421
Volume
20
Issue
7
Year of publication
1993
Pages
603 - 606
Database
ISI
SICI code
0142-2421(1993)20:7<603:PAISOZ>2.0.ZU;2-E
Abstract
For zeolites that exhibit ion conductivity, the surface charge in the application of surface spectroscopy (XPS, UPS, ISS) may be significant ly reduced by using elevated measurement temperatures. On this basis, a measurement technique has been developed that allows the application of ISS and UPS to zeolites and the detection of differential charging effects in XPS. Both the new perspectives and the limitations of this technique are illustrated by examples of Y zeolites exchanged with la nthanum and with silver.