X-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES WITH A BIAS-POTENTIAL METHOD FOR STUDYING SILANE ALUMINUM INTERFACES

Authors
LEUNG YL YANG YP WONG PC MITCHELL KAR FOSTER T
Citation
Yl. Leung et al., X-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES WITH A BIAS-POTENTIAL METHOD FOR STUDYING SILANE ALUMINUM INTERFACES, Journal of materials science letters, 12(11), 1993, pp. 844-846
Citations number
14
Categorie Soggetti
Material Science
Journal title
Journal of materials science letters → ACNP
ISSN journal
02618028
Volume
12
Issue
11
Year of publication
1993
Pages
844 - 846
Database
ISI
SICI code
0261-8028(1993)12:11<844:XPSSWA>2.0.ZU;2-L