EDGE EFFECTS AND A METHOD OF DEFECT SIZING FOR TRANSIENT THERMOGRAPHY

Authors
ALMOND DP LAU SK
Citation
Dp. Almond et Sk. Lau, EDGE EFFECTS AND A METHOD OF DEFECT SIZING FOR TRANSIENT THERMOGRAPHY, Applied physics letters, 62(25), 1993, pp. 3369-3371
Citations number
9
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
62
Issue
25
Year of publication
1993
Pages
3369 - 3371
Database
ISI
SICI code
0003-6951(1993)62:25<3369:EEAAMO>2.0.ZU;2-W
Abstract
Thermal edge effects for a cracklike defect have been calculated using the Wiener-Hopf technique. These have been used in an analytical mode l to explain transient thermographic image formation. The analysis has led to a simple method for defect sizing which is demonstrated using experimental results.