SYMBOLIC-DYNAMICAL ANALYSIS OF A TRANSITION BETWEEN DIFFERENT LIMIT-CYCLES OBSERVED IN A SEMICONDUCTOR EXPERIMENT

Authors
FLATGEN G RICHTER R KITTEL A HEINZ G HIRSCH M PEINKE J PARISI J
Citation
G. Flatgen et al., SYMBOLIC-DYNAMICAL ANALYSIS OF A TRANSITION BETWEEN DIFFERENT LIMIT-CYCLES OBSERVED IN A SEMICONDUCTOR EXPERIMENT, Physics letters. A, 177(2), 1993, pp. 148-152
Citations number
19
Categorie Soggetti
Physics
Journal title
Physics letters. A → ACNP
ISSN journal
03759601
Volume
177
Issue
2
Year of publication
1993
Pages
148 - 152
Database
ISI
SICI code
0375-9601(1993)177:2<148:SAOATB>2.0.ZU;2-#
Abstract
Low-temperature semiconductor impact ionization breakdown typically ex hibits spontaneous current oscillations depending sensitively upon ext ernal control parameters. Discrete characteristics of the time series are transformed into a symbolic sequence. We determine the information entropies together with the order of the Markov process underlying th e dynamics. These quantities allow one to characterize various transit ions between different attractors in a quantitative way.