Gd. Gilliland et al., MINORITY-CARRIER RECOMBINATION KINETICS AND TRANSPORT IN SURFACE-FREEGAAS ALXGA1-XAS DOUBLE HETEROSTRUCTURES/, Journal of applied physics, 73(12), 1993, pp. 8386-8396
We have measured room-temperature band-to-band recombination decay kin
etics in superior quality GaAs heterostructures, and have observed the
longest lifetime (2.5 mus) observed for any GaAs/AlxGa1-xAs structure
to date. Additionally, using a novel time-resolved optical photolumin
escence imagining technique, analogous to the Haynes-Shockley experime
nt, we have also measured room-temperature minority-carrier transport
in this series of ''surface-free'' GaAs/Al0.3Ga0.7As double heterostru
ctures, measurements only possible in high-quality samples with long l
ifetimes and intense photoluminescence. We find the transport to be di
ffusive with diffusion lengths of greater than or similar to 100 mum.
Further, we find, for thick structures, minority-carrier transport is
hole-dominated ambipolar diffusion, as expected for high-purity n-type
material. However, for thinner structures, we find that the minority-
carrier transport is time dependent, changing from ambipolar diffusion
at early times, as in thick structures, to electron-dominated diffusi
on at later times. We show that these structures become effectively p-
type modulation doped due to the relative ''impurity'' and thickness o
f the AlxGa1-xAs compared to the GaAs. As a result, the minority-carri
er species changes from holes to electrons for decreasing GaAs layer t
hicknesses. Cumulatively, we show the band-to-band recombination decay
kinetics and carrier transport results to be in excellent qualitative
and quantitative agreement. Moreover, our results are in excellent ag
reement with electrical transport measurements of electron and hole mo
bilities. Finally, with our measured room-temperature lifetimes and mi
nority-carrier transport measurements versus GaAs layer thickness, we
accurately calculate the interface recombination velocity for these st
ructures, with the result S is similar to 40 cm/s, among the lowest ev
er reported for any GaAs/AlxGa1-xAs structure.