A METHOD OF X-RAY-DIFFRACTION EXAMINATION OF THIN SUPERCONDUCTING FILMS

Authors
MALYGIN ND SHCHUROV AF GRACHEVA TA
Citation
Nd. Malygin et al., A METHOD OF X-RAY-DIFFRACTION EXAMINATION OF THIN SUPERCONDUCTING FILMS, Industrial laboratory, 58(9), 1992, pp. 840-843
Citations number
7
Categorie Soggetti
Material Science","Metallurgy & Mining
Journal title
Industrial laboratory → ACNP
ISSN journal
00198447
Volume
58
Issue
9
Year of publication
1992
Pages
840 - 843
Database
ISI
SICI code
0019-8447(1992)58:9<840:AMOXEO>2.0.ZU;2-H