P. Dannetun et al., THE CHEMICAL AND ELECTRONIC-STRUCTURE OF THE INTERFACE BETWEEN ALUMINUM AND POLYTHIOPHENE SEMICONDUCTORS, The Journal of chemical physics, 99(1), 1993, pp. 664-672
We have investigated the chemical nature and the electronic structure
of the interface between a low work function metal, aluminum, and a co
njugated polymer semiconductor, polythiophene. We have studied the ini
tial stages of the interface formation by depositing the metal onto th
e surface of a polymer film. Charge transfer processes between the met
al and the polymer are analyzed using core-level x-ray photoelectron s
pectroscopy (XPS); the evolution upon metallization of the valence ele
ctronic levels directly related to the polymer electronic structure is
followed with ultraviolet photoelectron spectroscopy (UPS). With thes
e techniques, we investigate the deposition of aluminum on two polythi
ophene systems (i) the alkyl-substituted poly-3-octylthiophene and (ii
) the alpha-sexithiophene oligomer. The experimental data are compared
to the results of a recent quantum chemical study on model systems co
nsisting of thiophene oligomers (up to sexithiophene) interacting with
a few Al atoms. The interaction of polythiophene with Al atoms is fou
nd to modify dramatically the structure of the conjugated backbone, as
strong carbon-aluminum bonds are formed in the a positions of the thi
ophene rings. A large charge transfer takes place from the Al atoms to
the polymer chain, and the upper pi levels of the polymer are strongl
y affected. The metallization is contrasted to the doping of conjugate
d polymers with alkali metals.