I. Hashim et al., EVOLUTION OF STRUCTURAL AND MAGNETIC-PROPERTIES IN TA NI81FE19 MULTILAYER THIN-FILMS/, Journal of applied physics, 74(1), 1993, pp. 458-464
The interdiffusion kinetics in short period (12.8 nm) Ta/Ni81Fe19 poly
crystalline multilayer films has been investigated and related to the
evolution of soft magnetic properties upon thermal annealing in the te
mperature range 300-600-degrees-C. Small angle x-ray diffraction and t
ransmission electron microscopy were used to estimate the multilayer p
eriod. Interdiffusion in the multilayers was directly computed from th
e decay of the satellites near (000) in a small angle x-ray diffractio
n spectrum. A kinetic analysis of interdiffusion suggests that grain g
rowth is concurrent with grain boundary diffusion of Ta in Ni81Fe19. T
he evolution of soft magnetic properties of Ni81Fe19, i.e., lowering o
f 4piM(s) and increase in coercivity H(c), also lend support to the ab
ove analysis.