Measurements of the temperature dependence of the current-voltage char
acteristics of heterojunction light-emitting diodes fabricated by depo
siting indium tin oxide onto the surface of electrochemically etched p
-type silicon (porous silicon) are presented, and the results are comp
ared with those for adjacent devices formed on nonprocessed bulk silic
on. The barrier height for the diodes which exhibit quantum confinemen
t effects was determined to be 0.42 eV. Unlike the bulk silicon device
s, the diodes prepared on porous silicon did not manifest a photovolta
ic effect. These observations allow us to present a potential energy d
iagram for porous silicon heterojunction diodes which indicates barrie
rs in both the conduction band and the valence band.