A. Gasparotto et al., ION-IMPLANTATION AND ANNEALING OF FE FOR SEMIINSULATING LAYERS FORMATION IN INP, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 773-776
We investigated the Fe ion implantation and annealing processes used t
o obtain semi-insulating buried layers in InP epitaxial structures for
current confinement in laser device applications. SIMS and RBS-channe
ling were used as analytical tools. The results show that the annealin
g is a rather complicated process when the implant causes sample amorp
hization: high surface reactivity, anomalous dopant diffusion and segr
egation at damage sites together with inhomogeneous lattice reconstruc
tion are observed.