IN-SITU ANALYSIS OF IRRADIATION-INDUCED CRYSTAL NUCLEATION IN AMORPHOUS-SILICON - A MICROSCOPE FOR THERMODYNAMIC PROCESSES IN NUCLEATION

Citation
Jh. Shin et Ha. Atwater, IN-SITU ANALYSIS OF IRRADIATION-INDUCED CRYSTAL NUCLEATION IN AMORPHOUS-SILICON - A MICROSCOPE FOR THERMODYNAMIC PROCESSES IN NUCLEATION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 973-977
Citations number
16
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
ISSN journal
0168583X
Volume
80-1
Year of publication
1993
Part
2
Pages
973 - 977
Database
ISI
SICI code
0168-583X(1993)80-1:<973:IAOICN>2.0.ZU;2-M
Abstract
Ion irradiation (600 keV Xe+ ) at high temperatures and [ow irradiatio n ion fluxes greatly enhances the nucleation rate of crystalline silic on in an amorphous matrix, but has a negligible effect on the growth r ate of crystalline grains. In situ electron microscopy during ion irra diation was employed to quantitatively analyze transient and steady-st ate crystal nucleation. Termination of ion irradiation during transien t nucleation produces changes in the nucleation rate that can best be accounted for by irradiation-induced modification of the thermodynamic barrier to crystal nucleation. Observation of irradiation-induced cha nges in the transient nucleation rate also enables evolution of the su bcritical cluster distribution, which has to date defied direct observ ation, to be inferred.