XPS STUDIES ON THE CHARGE STATES OF CR AND CU ATOMS IMPLANTED INTO ALPHA-AL2O3 AND MGO SINGLE-CRYSTALS

Citation
T. Futagami et al., XPS STUDIES ON THE CHARGE STATES OF CR AND CU ATOMS IMPLANTED INTO ALPHA-AL2O3 AND MGO SINGLE-CRYSTALS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 1168-1170
Citations number
5
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
ISSN journal
0168583X
Volume
80-1
Year of publication
1993
Part
2
Pages
1168 - 1170
Database
ISI
SICI code
0168-583X(1993)80-1:<1168:XSOTCS>2.0.ZU;2-O
Abstract
The charge state of Cr and Cu atoms implanted into alpha-Al2O3 and MgO single crystals has been studied by X-ray photoelectron spectroscopy (XPS). The implantation has been performed at 200 and 300 keV to doses of 10(16) to 10(18)/cm2. The implanted Cr atoms prefer to form aggreg ates in alpha-Al2O3 implanted to high doses while they are preferentia lly stabilized as Cr3+ in MgO. The presence of Cu2+ has been observed only in MgO and the Cu2+ fraction decreases with higher concentration of implanted Cu atoms.