Y. Mokuno et al., MASKLESS FABRICATION OF CONTACT VIAS BY FOCUSED MEV HEAVY-ION BEAM, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 1292-1295
A focused MeV nickel ion beam was used for making contact vias in a mu
ltilayer structure through a passivation layer. The structures had two
aluminum layers isolated by a Si3N4 insulating layer. The distributio
n of implanted nickel ions was controlled by changing the implantation
energy. After the implantation, current-voltage characteristics betwe
en the two aluminum layers were measured by a two-point probe method.
When the distribution of nickel was adjusted at the Si3N4 insulating l
ayer, electrical conduction was observed at the nickel fluence of 1 x
10(17)-2 x 10(18) ions/cm2, and it was found that the conductivity was
increased and the breakdown voltage was decreased as the fluence of n
ickel ions increased.