ION-BEAM MIXING OF TIC FE BILAYERS

Authors
GESAN P DELAFOND J CAHOREAU M EYMERY JP GAREM H
Citation
P. Gesan et al., ION-BEAM MIXING OF TIC FE BILAYERS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 394-397
Citations number
13
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
Journal title
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms → ACNP
ISSN journal
0168583X
Volume
80-1
Year of publication
1993
Part
1
Pages
394 - 397
Database
ISI
SICI code
0168-583X(1993)80-1:<394:IMOTFB>2.0.ZU;2-M
Abstract
TiC/Fe bilayers deposited by ion beam sputtering have been irradiated with 340 keV Xe2+ ions up to 10(16) ions cm-2 at LN2 temperature. The samples have been analysed by means of secondary ion mass spectroscopy (SIMS) and transmission electron microscopy (TEM) on cross-sectioned samples. An intermediate layer with an amorphous structure at the inte rface was observed after irradiation. The mixing efficiency of titaniu m is lower than that of carbon. The titanium mixing variance displays a linear relationship with fluence, while the carbon mixing variance d oes not scale linearly with fluence.