Crystalline boron nitride thin films have been deposited on silicon su
bstrates by MO-CVD at different temperatures using a single source III
-V precursor in N2 ambient. The deposited films are characterized by X
RD and IR techniques. XRD confirms that the films are mostly polycryst
alline with (111), (200), (004), (103) oriented cubic and hexagonal ph
ases of boron nitride. IR also shows a mixture of cubic and nexagonal
boron nitride phases.