M. Yumura et al., ATOMIC-FORCE MICROSCOPIC STUDY ON THE MOLECULAR ARRANGEMENT OF HIGHLYCONDUCTIVE LB FILMS OF METAL(DMIT)2, Synthetic metals, 57(1), 1993, pp. 3865-3870
The atomic force microscope (AFM) was used to obtain the images of the
LB film of tridecylmethylammonium-Au(dmit)2 complex mixed with icosan
oic acid. A single-layered sample of the as-deposited LB film revealed
a heterogeneous structure with very thin plate-like crystallites of t
he order of mum distributed in the film surface. The height of the cry
stallite was about 18 nm measured from the planar region in which a mo
nolayer of icosanoic acid was assumed to be present. This thickness co
rresponded to a stacking of ca. 10 molecules of Au(dmit)2 with each of
the molecular plane almost parallel to the film surface, taking into
account the molecular arrangement in a single crystal. No epitaxial de
position was observed for a multilayered sample, which was shown by th
e almost random stacking of the plate-like crystallites. The AFM image
changed with the electrochemical oxidation that was necessary to make
the film conductive. The blurring of the outline of the plate-like cr
ystallites was observed, suggesting a structural change of the crystal
lites accompanied by the electrochemical oxidation.