Lj. Meng et Mp. Dossantos, THE INFLUENCE OF OXYGEN PARTIAL-PRESSURE ON THE PROPERTIES OF DC REACTIVE MAGNETRON-SPUTTERED TITANIUM-OXIDE FILMS, Applied surface science, 68(3), 1993, pp. 319-325
Titanium oxide thin films were grown on glass substrates by DC reactiv
e magnetron sputtering at various oxygen partial pressures. The films
were characterized using X-ray diffraction (XRD), X-ray photoelectron
spectroscopy (XPS), scanning electron microscopy (SEM) and optical tra
nsmittance spectra. The effects of the oxygen partial pressure on the
structural and optical properties of titanium oxide films were investi
gated.