OVERVIEW OF COMPOSITIONAL MEASUREMENT TECHNIQUES FOR HGCDTE WITH EMPHASIS ON IR TRANSMISSION, ENERGY-DISPERSIVE X-RAY-ANALYSIS AND OPTICAL REFLECTANCE

Authors
PRICE SL BOYD PR
Citation
Sl. Price et Pr. Boyd, OVERVIEW OF COMPOSITIONAL MEASUREMENT TECHNIQUES FOR HGCDTE WITH EMPHASIS ON IR TRANSMISSION, ENERGY-DISPERSIVE X-RAY-ANALYSIS AND OPTICAL REFLECTANCE, Semiconductor science and technology, 8(6), 1993, pp. 842-859
Citations number
62
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Condensed Matter","Material Science
Journal title
Semiconductor science and technology → ACNP
ISSN journal
02681242
Volume
8
Issue
6
Year of publication
1993
Supplement
S
Pages
842 - 859
Database
ISI
SICI code
0268-1242(1993)8:6<842:OOCMTF>2.0.ZU;2-T
Abstract
Three techniques for determining the composition (x = mole fraction of CdTe) of Hg1-xCdxTe are reviewed. These three techniques are infrared transmission (often called FTIR, for Fourier transform infrared) spec troscopy, energy dispersive x-ray analysis (EDX) and optical reflectan ce (OR). A brief summary of several methods for determining compositio n in Hg1-xCdxTe is included.