Sl. Price et Pr. Boyd, OVERVIEW OF COMPOSITIONAL MEASUREMENT TECHNIQUES FOR HGCDTE WITH EMPHASIS ON IR TRANSMISSION, ENERGY-DISPERSIVE X-RAY-ANALYSIS AND OPTICAL REFLECTANCE, Semiconductor science and technology, 8(6), 1993, pp. 842-859
Three techniques for determining the composition (x = mole fraction of
CdTe) of Hg1-xCdxTe are reviewed. These three techniques are infrared
transmission (often called FTIR, for Fourier transform infrared) spec
troscopy, energy dispersive x-ray analysis (EDX) and optical reflectan
ce (OR). A brief summary of several methods for determining compositio
n in Hg1-xCdxTe is included.