EFFECT OF TITANIUM-OXIDE LAYER ON DIELECTRIC CHARACTERISTICS OF PYROGENIC SILICA

A study has been made of the influence of the synthesis temperature on the chemical and phase composition of titanosilica, synthesized by th e molecular layering method on Aerosil A-390 in the temperature interv al 473-873 K. The character of the change in dielectric spectra of the products in the frequency interval 3-10 MHz has been examined. The fr equency dependence epsilon'' = f(omega) for the titanosilica has a ver y distinct relaxation maximum at 8.5 MHz, corresponding to a sorption center on the surface of the silica matrix. It has been established th at the magnitudes of epsilon'' of the relaxation maximum and epsilon' are related to the synthesis temperature and the number of cycles of m olecular layering.