F. Ren et al., SELF-ALIGNED INGAP GAAS HETEROJUNCTION BIPOLAR-TRANSISTORS FOR MICROWAVE-POWER APPLICATION/, IEEE electron device letters, 14(7), 1993, pp. 332-334
As an alternative to AlGaAs/GaAs heterojunction bipolar transistors (H
BT's) for microwave applications, InGaP/GaAs HBT's with carbon-doped b
ase layers grown by metal organic molecular beam epitaxy (MOMBE) are d
emonstrated with excellent dc, RF, and microwave performance. As previ
ously reported, with a 700-angstrom-thick base layer (135-OMEGA/square
sheet resistance), a dc current gain of 25, and cutoff frequency and
maximum frequency of oscillation above 70 GHz were measured for a 2 X
5-mum2 emitter area device. A device with 12 cells, each consisting of
a 2 x 15-mum2 emitter area device for a total emitter area of 360 mum
2, was power tested at 4 GHz under continuous-wave (CW) bias condition
. The device delivered 0.6-W output power with 13-dB linear gain and a
power-added efficiency of 50%.