The rate of growth and the index of refraction of water vapour vacuum
cryocondensates deposited onto mirror metal substates are measured in
a temperature range of 15 to 180 K. The reflection spectra or layers 0
.25-2.5 mum thick are studied in a wavelength region ranged from 2 to
20 mum. It is shown that the peculiar features in the condensation tem
perature dependences of growth rate and refraction index of the cryoco
ndensates are consistent with the temperature ranges of the existence
of different solid-phase structures obtained from the data on IR spect
roscopy. The effect of structure transitions within a cryocondensate l
ayer on the shape of absorption bands in the regions of 3 and 10-17 mu
m is studied comprehensively.