ANALYSIS OF STERIC REPULSION FORCES IN ATOMIC-FORCE MICROSCOPE WITH POLYETHYLENE OXIDE IN AQUEOUS-MEDIA

Citation
Si. Jeon et Jd. Andrade, ANALYSIS OF STERIC REPULSION FORCES IN ATOMIC-FORCE MICROSCOPE WITH POLYETHYLENE OXIDE IN AQUEOUS-MEDIA, Bulletin of the Korean Chemical Society, 14(3), 1993, pp. 352-356
Citations number
33
Categorie Soggetti
Chemistry
ISSN journal
02532964
Volume
14
Issue
3
Year of publication
1993
Pages
352 - 356
Database
ISI
SICI code
0253-2964(1993)14:3<352:AOSRFI>2.0.ZU;2-5
Abstract
We present a theoretical analysis for the use of long-range intermolec ular steric repulsion forces for imaging by atomic force microscope (A FM). Polyethylene oxide (PEO) is assumed to be terminally attaching to a spherical AFM tip in aqueous media. Only two long-range intermolecu lar forces (van der Waals attraction and steric repulsion) are conside red. All calculated forces are near 10(-11) N, which should not produc e deformation of the soft protein surface. Calculations are presented as a function of surface density and chain length of terminally attach ed PEO, and other variables. Longer chain length and maximal surface d ensity of terminally attached PEO to a smaller sized spherical AFM tip (modified AFM system) is appropriate to obtain optimum images of prot eins on the surface.