Si. Jeon et Jd. Andrade, ANALYSIS OF STERIC REPULSION FORCES IN ATOMIC-FORCE MICROSCOPE WITH POLYETHYLENE OXIDE IN AQUEOUS-MEDIA, Bulletin of the Korean Chemical Society, 14(3), 1993, pp. 352-356
We present a theoretical analysis for the use of long-range intermolec
ular steric repulsion forces for imaging by atomic force microscope (A
FM). Polyethylene oxide (PEO) is assumed to be terminally attaching to
a spherical AFM tip in aqueous media. Only two long-range intermolecu
lar forces (van der Waals attraction and steric repulsion) are conside
red. All calculated forces are near 10(-11) N, which should not produc
e deformation of the soft protein surface. Calculations are presented
as a function of surface density and chain length of terminally attach
ed PEO, and other variables. Longer chain length and maximal surface d
ensity of terminally attached PEO to a smaller sized spherical AFM tip
(modified AFM system) is appropriate to obtain optimum images of prot
eins on the surface.