X-RAY AND ELECTRON-OPTICAL CHARACTERIZATION OF ZNSE(CO) CRYSTAL WITH NATURAL FACE

Using complementary X-ray and electron-optical methods, a ZnSe(Co) cry stal with natural face was investigated. X-ray diffraction methods suc h as double-crystal X-ray reflection topography, double-crystal diffra ctometry for rocking curve measurements, precise lattice constant meas urements by the Bond technique were used for crystal structure charact erization and X-ray fluorescence method for studies of chemical compos ition along the crystal. The scanning electron microscopic image of th e crystal surface and reflection diffraction of the high-energy electr ons enriched the crystal structure characterization. It was shown that X-ray characterization and reflection high-energy electron diffractio n can be regarded as very important complementary tools for non-destru ctive investigation of the ZnSe(Co) crystal surface layers.