The rapid progress in high technology constantly poses new challenges
for Analytical Chemistry and prompts the development of new techniques
and procedures. The influence is particularly strong in surface and i
nterface analysis, which is developing at a rapid pace. This paper dis
cusses some of the frontier areas like high-resolution depth-distribut
ion analysis of trace elements, quantitative depth distribution analys
is of ultra thin-layer systems, quantitative trace element analysis in
monolayers, 3-dimensional stereometric analysis, molecular analysis,
in-situ atomic resolution analysis of surfaces (chemical nanoscopy). M
ethodological approaches are discussed as well as results obtained mai
nly with solid state mass spectrometry and atomic force microscopy.