TRENDS IN SURFACE AND INTERFACE ANALYSIS

Citation
M. Grasserbauer et al., TRENDS IN SURFACE AND INTERFACE ANALYSIS, Fresenius' journal of analytical chemistry, 346(6-9), 1993, pp. 594-603
Citations number
33
Categorie Soggetti
Chemistry Analytical
ISSN journal
09370633
Volume
346
Issue
6-9
Year of publication
1993
Pages
594 - 603
Database
ISI
SICI code
0937-0633(1993)346:6-9<594:TISAIA>2.0.ZU;2-8
Abstract
The rapid progress in high technology constantly poses new challenges for Analytical Chemistry and prompts the development of new techniques and procedures. The influence is particularly strong in surface and i nterface analysis, which is developing at a rapid pace. This paper dis cusses some of the frontier areas like high-resolution depth-distribut ion analysis of trace elements, quantitative depth distribution analys is of ultra thin-layer systems, quantitative trace element analysis in monolayers, 3-dimensional stereometric analysis, molecular analysis, in-situ atomic resolution analysis of surfaces (chemical nanoscopy). M ethodological approaches are discussed as well as results obtained mai nly with solid state mass spectrometry and atomic force microscopy.