A. Straw et al., IMAGING OF DOMAINS AND CURRENT FILAMENTS IN GAAS ALXGA1-XAS MULTIQUANTUM WELLS/, Semiconductor science and technology, 8(7), 1993, pp. 1303-1308
The field contrast mode of a scanning electron microscope has been use
d to image high-field domains and current filaments in GaAs/AlxGa1-xAs
multi-quantum wells. In samples where negative differential resistanc
e and current instabilities occur, high-field domains form. However, t
hese domains are shown to be either stationary or propagating slowly a
long the samples, in stark contrast to the case in bulk material. In s
amples where n-type negative differential resistance, caused by either
real-space transfer or intervalley transfer, is inhibited, high-field
domains do not form. In the case of moving domains they are shown to
annihilate before reaching the anode, probably by a lateral dissipativ
e mechanism. In samples where s-type negative differential resistance
occurs current filaments are shown to form, which leads to the irrever
sible destruction of the material.