LEAKAGE BEHAVIOR AND DISTORTION OF THE HYSTERESIS LOOP IN FERROELECTRIC THIN-FILMS

Citation
Lr. Zheng et al., LEAKAGE BEHAVIOR AND DISTORTION OF THE HYSTERESIS LOOP IN FERROELECTRIC THIN-FILMS, SCI CHINA E, 40(2), 1997, pp. 126-134
Citations number
15
Categorie Soggetti
Engineering,"Material Science
Journal title
SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES
ISSN journal
20950624 → ACNP
Volume
40
Issue
2
Year of publication
1997
Pages
126 - 134
Database
ISI
SICI code
2095-0624(1997)40:2<126:LBADOT>2.0.ZU;2-6
Abstract
Leakage behavior and distortion of the polarization hysteresis loop in ferroelectric thin films are analyzed by applying a totally depleted asymmetric back-to-back Schottky model, with the Pt/Pb(Zr, Ti)O-3/Pt ( Pt/P2T/Pt) sandwich structural thin film capacitor as an example, Some interesting phenomena resulting from the asymmetric interfaces, such as the leakage current level, the flat-band voltage, the disclosure of the hysteresis leap, and the change in the remanent polarization and coercive field, as well as the vertical drift of the polarization hyst eresis loop, are discussed in detail. The calculated results are also verified with experiments.