Bm. Chien et al., PLASMA SOURCE ATMOSPHERIC-PRESSURE IONIZATION DETECTION OF LIQUID INJECTION USING AN ION-TRAP STORAGE REFLECTRON TIME-OF-FLIGHT MASS-SPECTROMETER, Analytical chemistry, 65(14), 1993, pp. 1916-1924
In this work, the capabilities of an ion trap storage/reflectron time-
of-flight mass spectrometer (IT/reTOF-MS) combination have been explor
ed for detection of ions generated by liquid injection into plasma sou
rce atmospheric pressure ionization mass spectrometry. It is demonstra
ted herein that the ion trap provides an effective means of storing ex
ternally generated ions from 10 mus to 10 s prior to mass analysis via
pulsed dc extraction into the reTOF-MS device. The IT/reTOF storage c
apabilities provide the potential for nearly 100% duty cycle in conver
ting a continuous ion beam into a pulsed source for TOF. In addition,
it is shown that the storage capabilities of the device provide enhanc
ed resolution and sensitivity as the storage time is increased. Furthe
r, capabilities were developed for trapping of ions for other external
injection sources and ions with up to 300 eV have been trapped and st
ored for analysis by the IT/reTOF. In addition, the rf voltage was sho
wn to be an effective means of eliminating low-mass background peaks f
rom the trap and, thus, from the TOF mass spectrum obtained. The sensi
tivity of the device is also demonstrated with liquid injection techni
ques for a typical sample and found to be in the low-femtomole range.