ETCHING OF HIGHLY ORIENTED POLYETHYLENE B Y FUMING NITRIC-ACID

Authors
CHVALUN SN SHCHIRETS VS BAKEEV NF
Citation
Sn. Chvalun et al., ETCHING OF HIGHLY ORIENTED POLYETHYLENE B Y FUMING NITRIC-ACID, Vysokomolekularnye soedinenia. Seria A, 35(6), 1993, pp. 10000640-10000645
Citations number
11
Categorie Soggetti
Polymer Sciences
Journal title
Vysokomolekularnye soedinenia. Seria A → ACNP
ISSN journal
05075475
Volume
35
Issue
6
Year of publication
1993
Pages
10000640 - 10000645
Database
ISI
SICI code
0507-5475(1993)35:6<10000640:EOHOPB>2.0.ZU;2-D
Abstract
Structural changes in oriented polyethylene etched with fuming nitric acid were studied by X-ray diffraction measurements. Samples of variou s molecular masses and drawn to different drawing ratios were consider ed. Prolonged etching (up to 200 h), caused considerable changes in th e small-angle X-ray scattering patterns, notably, additional broad ref lection appeared. This reflection is assumed to be attributable to the presence in the polymer of a broad distribution of distances between the entanglements (the reactivity of the entanglements is higher than that of the remaining polymer) of the polymer network.