INTERFACE AND GROWTH-MODE CHARACTERIZATION OF CE FE AND CEH-APPROXIMATE-TO-2/FE MULTILAYERS BY X-RAY-DIFFRACTION AND RUTHERFORD BACKSCATTERING SPECTROSCOPY/

The detailed structural characterization of ion beam sputtered Ce/Fe a nd CeH(almost-equal-to 2)/Fe multilayers offers the possibility for a better understanding of their magnetic properties. In the case of the Ce/Fe multilayers the extension of the interface, as one of the most i mportant features, is determined to 5-7 angstrom by means of Monte Car lo simulations of the small-angle x-ray scattering diagrams. Below a c ritical thickness of almost-equal-to 24 angstrom Fe grows in an amorph ous structure. Here the interface extension is enhanced. In contrast a ll CeH(almost-equal-to 2)/Fe multilayers show nearly abrupt interfaces . X-ray scattering experiments at higher angles in reflection and tran smission mode provide information about the crystal structure, the tex ture, and the lateral dimensions of the grains in the samples. Depths profiles of the multilayers are generated by Rutherford backscattering spectroscopy, which confirm the well-ordered periodic structures. Sur prisingly indications of an island-like growth mode of the Fe layers o nto the Ce and CeH(almost-equal-to 2) layers could be resolved by usin g this procedure.