MINORITY-CARRIER DIFFUSION LENGTH AND EDGE SURFACE-RECOMBINATION VELOCITY IN INP

Authors
HAKIMZADEH R BAILEY SG
Citation
R. Hakimzadeh et Sg. Bailey, MINORITY-CARRIER DIFFUSION LENGTH AND EDGE SURFACE-RECOMBINATION VELOCITY IN INP, Journal of applied physics, 74(2), 1993, pp. 1118-1123
Citations number
26
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
74
Issue
2
Year of publication
1993
Pages
1118 - 1123
Database
ISI
SICI code
0021-8979(1993)74:2<1118:MDLAES>2.0.ZU;2-S
Abstract
A scanning electron microscope was used to obtain the electron-beam-in duced current (EBIC) profiles in InP specimens containing a Schottky b arrier perpendicular to the scanned (edge) surface. An independent tec hnique was used to measure the edge surface-recombination velocity (V( s)). These values were used in a fit of the experimental EBIC data wit h a theoretical expression for normalized EBIC [C. Donolato, Solid Sta te Electron. 25, 1077 (1982)] to obtain the electron (minority carrier ) diffusion length (L(n)).