PREFERENTIAL AXIS CONTROL OF YBA2CU3OX THIN-FILM BY QUASI-LATTICE-MATCH ENGINEERING

Citation
M. Mukaida et S. Miyazawa, PREFERENTIAL AXIS CONTROL OF YBA2CU3OX THIN-FILM BY QUASI-LATTICE-MATCH ENGINEERING, Journal of applied physics, 74(2), 1993, pp. 1209-1212
Citations number
20
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
74
Issue
2
Year of publication
1993
Pages
1209 - 1212
Database
ISI
SICI code
0021-8979(1993)74:2<1209:PACOYT>2.0.ZU;2-G
Abstract
The lowest temperature for c-axis preferred oriented thin film growth is investigated for films on different substrate materials. This tempe rature has a maximum when the lattice constant of the substrate matche s that of YBa2Cu3Ox. This result readily explains a-axis preferred ori ented film growth by the template technique. We propose quasilattice-m atch engineering as a technique for controlling the preferential orien tation axis of a part of a YBa2Cu3Ox thin film by using a seed layer w hose lattice mismatch differs from that of the substrate. The part of the YBa2Cu3Ox thin film on a PrGaO3 seed layer is a-axis oriented and the film directly deposited on a SrTiO3 substrate is c-axis oriented.