Im. Dmitrenko et al., LOW-TEMPERATURE LASER-SCANNING MICROSCOPY STUDIES OF THE CRITICAL-CURRENT SPATIAL-DISTRIBUTION IN HIGH-T(C)SUPERCONDUCTING FILMS, Fizika nizkih temperatur, 19(4), 1993, pp. 369-374
The process of destruction of superconductivity in high-T(c) supercond
ucting thin films of different quality by current has been visualized
using low-temperature laser scanning microscopy. The critical current
is shown to be determined by local irregularities and defects of the f
ilm which is to be taken into account when I-V curves are analysed. A
method to measure local critical current values in multiconnected circ
uits is proposed.