LOW-TEMPERATURE LASER-SCANNING MICROSCOPY STUDIES OF THE CRITICAL-CURRENT SPATIAL-DISTRIBUTION IN HIGH-T(C)SUPERCONDUCTING FILMS

Citation
Im. Dmitrenko et al., LOW-TEMPERATURE LASER-SCANNING MICROSCOPY STUDIES OF THE CRITICAL-CURRENT SPATIAL-DISTRIBUTION IN HIGH-T(C)SUPERCONDUCTING FILMS, Fizika nizkih temperatur, 19(4), 1993, pp. 369-374
Citations number
12
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
01326414
Volume
19
Issue
4
Year of publication
1993
Pages
369 - 374
Database
ISI
SICI code
0132-6414(1993)19:4<369:LLMSOT>2.0.ZU;2-1
Abstract
The process of destruction of superconductivity in high-T(c) supercond ucting thin films of different quality by current has been visualized using low-temperature laser scanning microscopy. The critical current is shown to be determined by local irregularities and defects of the f ilm which is to be taken into account when I-V curves are analysed. A method to measure local critical current values in multiconnected circ uits is proposed.