A technique for measuring small magnetic fields using a thin amorphous
magnetic film and the magneto-optic Kerr effect has been developed. A
thin film having in-plane uniaxial anisotropy is aligned such that an
external magnetic field rotates the film magnetization in a controlla
ble manner. This magnetization rotation is ''read'' optically by a coh
erent homodyne measurement of the amount of polarization rotation caus
ed by the magneto-optic Kerr effect during reflectance of polarized li
ght from the film surface, using one polarization as the local oscilla
tor. The resulting signal is linear in magnetic field. Initial noise e
quivalent magnetic field sensitivity measurements of the technique yie
ld 2 mOe/Hz 1/2 at a frequency of 8 mHz. Calculations indicate that se
nsitivities of order 10(-6) Oe/Hz 1/2 are obtainable using this techni
que.