FINITE-ELEMENT MODELING OF ELECTRODE SKIN CONTACT IMPEDANCE IN ELECTRICAL-IMPEDANCE TOMOGRAPHY

Citation
P. Hua et al., FINITE-ELEMENT MODELING OF ELECTRODE SKIN CONTACT IMPEDANCE IN ELECTRICAL-IMPEDANCE TOMOGRAPHY, IEEE transactions on biomedical engineering, 40(4), 1993, pp. 335-343
Citations number
17
Categorie Soggetti
Engineering, Biomedical
ISSN journal
00189294
Volume
40
Issue
4
Year of publication
1993
Pages
335 - 343
Database
ISI
SICI code
0018-9294(1993)40:4<335:FMOESC>2.0.ZU;2-N
Abstract
In electrical impedance tomography (EIT), we inject currents through a nd measure voltages from an array of surface electrodes. The measured voltages are sensitive to electrode-skin contact impedance because the contact impedance and the current density through this contact impeda nce are both high. We used large electrodes to provide a more uniform current distribution and reduce the contact impedance. A large electro de differs from a point electrode in that it has shunting and edge eff ects which cannot be modeled by a single resistor. We used the finite element method (FEM) to study the electric field distributions underne ath an electrode, and developed three models: a FEM model, a simplifie d FEM model and a weighted load model. We showed that the FEM models c onsidered both shunting and edge effects and matched closely the exper imental measurements. FEM models for electrodes can be used to improve the performance of an electrical impedance tomography reconstruction algorithm.