POLARIZATION ANALYZING SYSTEM FOR X-RAY MAGNETIC KERR ROTATION IN X-RAY MAGNETIC RESONANT SCATTERING

Authors
MORI K NAMIKAWA K FUNAHASHI Y HIGASHI Y ANDO M
Citation
K. Mori et al., POLARIZATION ANALYZING SYSTEM FOR X-RAY MAGNETIC KERR ROTATION IN X-RAY MAGNETIC RESONANT SCATTERING, Review of scientific instruments, 64(7), 1993, pp. 1825-1830
Citations number
15
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
Journal title
Review of scientific instruments → ACNP
ISSN journal
00346748
Volume
64
Issue
7
Year of publication
1993
Pages
1825 - 1830
Database
ISI
SICI code
0034-6748(1993)64:7<1825:PASFXM>2.0.ZU;2-Z
Abstract
We made a new polarization analyzing system for measuring a rotation o f major axis of elliptical polarization in x-ray magnetic resonant sca ttering. This system, based on a two-axis diffractometer, is character ized by introducing a 45-degrees linearly polarized x-ray incident bea m. Design and performance of the system are described. The rotation ca n be measured with precision of 0.2-degrees-0.3-degrees at the vicinit y of Gd L3-absorption edge where the maximum rotation is about -2-degr ees.