X-RAY-ABSORPTION SPECTROSCOPY - A PROBE FOR THE IN-SITU STUDY OF FILMS DEPOSITED AT A METAL ELECTROLYTE INTERFACE

Citation
A. Tadjeddine et G. Tourillon, X-RAY-ABSORPTION SPECTROSCOPY - A PROBE FOR THE IN-SITU STUDY OF FILMS DEPOSITED AT A METAL ELECTROLYTE INTERFACE, Soviet electrochemistry, 29(1), 1993, pp. 82-94
Citations number
48
Categorie Soggetti
Electrochemistry
Journal title
ISSN journal
00385387
Volume
29
Issue
1
Year of publication
1993
Pages
82 - 94
Database
ISI
SICI code
0038-5387(1993)29:1<82:XS-APF>2.0.ZU;2-K
Abstract
X-ray absorption spectroscopy (XAS) is a sensitive method for determin ing the oxidation state and the local order of an element under study when it is dissolved in a matrix or deposited on the surface of a subs trate of various nature. In the case of grazing incidence and fluoresc ence detection, this method can be used for the in situ study of the s tructural properties of a film found in a condensed medium. This metho d makes it possible to obtain the chemical and structural characterist ics of monolayers electrochemically deposited at a metal/electrolyte i nterface and fractions of such monolayers. A method which was develope d in the DCI storage ring and in LURE (Laboratoire pour l'Utilisation du Rayonnement Electromagnetique) for studying copper and zinc systems at the potentials for deposition on single-crystal gold substrates ha s been described The effect of the crystallographic orientation of the substrate and the coverage of the structure with the adsorbate has be en studied in the Cu/Au system. The formation of a very stable zinc-co pper compound, which can be oxidized only at very positive potentials, has been demonstrated in the Zn/Au system.