A. Tadjeddine et G. Tourillon, X-RAY-ABSORPTION SPECTROSCOPY - A PROBE FOR THE IN-SITU STUDY OF FILMS DEPOSITED AT A METAL ELECTROLYTE INTERFACE, Soviet electrochemistry, 29(1), 1993, pp. 82-94
X-ray absorption spectroscopy (XAS) is a sensitive method for determin
ing the oxidation state and the local order of an element under study
when it is dissolved in a matrix or deposited on the surface of a subs
trate of various nature. In the case of grazing incidence and fluoresc
ence detection, this method can be used for the in situ study of the s
tructural properties of a film found in a condensed medium. This metho
d makes it possible to obtain the chemical and structural characterist
ics of monolayers electrochemically deposited at a metal/electrolyte i
nterface and fractions of such monolayers. A method which was develope
d in the DCI storage ring and in LURE (Laboratoire pour l'Utilisation
du Rayonnement Electromagnetique) for studying copper and zinc systems
at the potentials for deposition on single-crystal gold substrates ha
s been described The effect of the crystallographic orientation of the
substrate and the coverage of the structure with the adsorbate has be
en studied in the Cu/Au system. The formation of a very stable zinc-co
pper compound, which can be oxidized only at very positive potentials,
has been demonstrated in the Zn/Au system.