ELECTRON-PARAMAGNETIC-RESONANCE OF ERBIUM-DOPED SILICON

Citation
Jd. Carey et al., ELECTRON-PARAMAGNETIC-RESONANCE OF ERBIUM-DOPED SILICON, Applied physics letters, 69(25), 1996, pp. 3854-3856
Citations number
26
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
69
Issue
25
Year of publication
1996
Pages
3854 - 3856
Database
ISI
SICI code
0003-6951(1996)69:25<3854:EOES>2.0.ZU;2-P
Abstract
Electron paramagnetic resonance measurements have been made on samples of float zone silicon, implanted with 10(15) Er/cm(2), One sample was coimplanted with oxygen to give an impurity concentration of 10(20) O /cm(3) and 10(19) Er/cm(3). In this coimplanted sample, sharp lines ar e observed which are identified as arising from a single spin 1/2 Er3 center having ag tensor exhibiting monoclinic C-1h symmetry. The prin cipal g values and tilt angle are g(1) = 0.80, g(2) = 5.45, g(3) = 12. 60, and tau = 2.6 degrees. In the absence of O, the sharp lines are no t observed. No Er3+ cubic centers were detected in either sample. Poss ible structures for the center are discussed. (C) 1996 American Instit ute of Physics.