DIMINISHING SIGN ANOMALY AND SCALING BEHAVIOR OF THE MIXED-STATE HALLRESISTIVITY IN TL2BA2CA2CU3O10 FILMS CONTAINING COLUMNAR DEFECTS

The issues of sign reversal of the Hall voltage and scaling between lo ngitudinal (rho(xx)) and Hall (rho(xy)) resistivities are studied in T l2Ba2Ca2Cu3O10 films in which the vortex dynamics is drastically chang ed by flux pinning at heavy-ion-irradiation-induced linear defects. Wh ile the sign anomaly diminishes with increasing defect concentration, the power law rho(xy) approximately rho(xx)beta, beta = 1.85 +/- 0.1, holds even after irradiation. This result shows that the scaling is a universal feature of the mixed state in this system. The sign anomaly, on the other hand, is not consistent with a model that invokes pinnin g-induced backflow in the vortex core as the mechanism for this effect .