EFFECTIVE THERMAL-CONDUCTIVITY ANALYSIS OF 1.55-MU-M INGAASP INP VERTICAL-CAVITY TOP-SURFACE-EMITTING MICROLASERS/

Authors
OSINSKI M NAKWASKI W
Citation
M. Osinski et W. Nakwaski, EFFECTIVE THERMAL-CONDUCTIVITY ANALYSIS OF 1.55-MU-M INGAASP INP VERTICAL-CAVITY TOP-SURFACE-EMITTING MICROLASERS/, Electronics Letters, 29(11), 1993, pp. 1015-1016
Citations number
5
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronics Letters → ACNP
ISSN journal
00135194
Volume
29
Issue
11
Year of publication
1993
Pages
1015 - 1016
Database
ISI
SICI code
0013-5194(1993)29:11<1015:ETAO1I>2.0.ZU;2-P
Abstract
An analytical approach is developed and appoied to investigate the the rmal properties of 1.55 mum microresonator vertical-cavity surface-emi tting lasers (VCSELs) mounted substrate-down. The results indicate tha t difficulties with obtaining the CW operation of long-wavelength VCSE Ls are primarily associated with intrinsic properties (such as low T0) rather than with their thermal resistance.