Pf. Fewster, STRUCTURAL CHARACTERIZATION OF MATERIALS BY COMBINING X-RAY-DIFFRACTION SPACE MAPPING AND TOPOGRAPHY, Philips journal of research, 47(3-5), 1993, pp. 235-245
Recent advances in X-ray diffraction has aided the interpretation and
extended the possibilities in structural analysis of materials. By cre
ating a ''delta-function like'' diffraction space probe the 3-dimensio
nal shape of the scattering form from a crystalline sample can be dete
rmined. Previously we have been restricted to ''pseudo'' 1-dimensional
scans requiring assumptions about the material properties or probes w
ith complex instrument artifacts complicating the interpretation. This
additional flexibility has increased the ease of interpretation since
different scattering features are isolated. This has been further enh
anced by using the same probe to perform topography therefore the scat
tering features can be related directly to topographic images of defec
ts, etc. This has increased our understanding of the origins of diffus
e scattering and improved our understanding of the diffraction shapes.
Because of the high resolution obtainable unexpected features have be
en revealed and the combination with topography has helped in the unde
rstanding of their origin. The basics of the methods are covered and i
llustrated with a few examples of the applications for such an instrum
ent.