ONLINE TESTING OF STATICALLY AND DYNAMICALLY SCHEDULED SYNTHESIZED SYSTEMS

Citation
Ad. Brown et al., ONLINE TESTING OF STATICALLY AND DYNAMICALLY SCHEDULED SYNTHESIZED SYSTEMS, IEEE transactions on computer-aided design of integrated circuits and systems, 16(1), 1997, pp. 47-57
Citations number
21
Categorie Soggetti
Computer Application, Chemistry & Engineering","Computer Science Hardware & Architecture
ISSN journal
02780070
Volume
16
Issue
1
Year of publication
1997
Pages
47 - 57
Database
ISI
SICI code
0278-0070(1997)16:1<47:OTOSAD>2.0.ZU;2-3
Abstract
Most digital systems at some time during use have areas (modules) that are ''dead'' in the sense that they do not contain valid data, i.e., the data that was processed or generated by that area has been passed on to a subsequent stage and will not be required (read) again, In a s ynthesized system, where the flow of data is determined explicitly by an on-chip (synthesized) controller, the question of which areas will be dead or not (and when) is known in advance, There are areas and tim es when the ''use'' is data-dependent, but then the use is known to th e controller at that time, This deadtime can be exploited to run a tes t pattern (either complete or in part) through the unused area, thereb y giving the ability to continuously monitor the ''health'' of the ove rall system with very little (sometimes zero) impact on the processing capability, This has obvious applications in situations where reliabi lity is a concern, There exist systems where an area is so heavily use d that it is impossible to perform any testing at a serious rate; in t his case the area may either be partially tested (or tested at a lower rate) or the processing of ''real'' data periodically halted to allow a more thorough test to take place with concomitant throughput degrad ation. This paper describes a behavioral synthesis system that can det ect and exploit dead areas for automatic testing, Pertinent aspects of the controller are described, and a number of dead area statistics (i ncluding ''test throughput'') generated from real designs are reported .