PREFERENTIAL SPUTTERING OF PT-NI ALLOY SINGLE-CRYSTALS STUDIED BY SCANNING-TUNNELING-MICROSCOPY

Citation
M. Schmid et al., PREFERENTIAL SPUTTERING OF PT-NI ALLOY SINGLE-CRYSTALS STUDIED BY SCANNING-TUNNELING-MICROSCOPY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 82(2), 1993, pp. 259-268
Citations number
36
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
ISSN journal
0168583X
Volume
82
Issue
2
Year of publication
1993
Pages
259 - 268
Database
ISI
SICI code
0168-583X(1993)82:2<259:PSOPAS>2.0.ZU;2-9
Abstract
Due to its composition, the altered layer of preferentially sputtered alloys has a lattice constant different from that of the bulk. This la ttice mismatch can lead to the formation of dislocations or reconstruc tions, which have been studied on different crystallographic faces. Wh ile a subsurface dislocation network exists on the (111) plane, parall el dislocations are found below the (110) surface. The (100) surface e xhibits a shifted-row reconstruction, which is tentatively attributed to the stress induced by lattice mismatch between the bulk and the Pt- enriched surface. The annealing process of the sputtered Pt25Ni75(111) surface is studied in detail by evaluation of the mismatch dislocatio ns and low energy ion scattering data.