W. Kriegseis et al., DEPENDENCE OF THE TSEE RESPONSE OF BEO THIN-FILMS ON PHOTON ENERGY AND COMPOSITION OF COVER MATERIALS, Radiation protection dosimetry, 47(1-4), 1993, pp. 143-146
Citations number
NO
Categorie Soggetti
Radiology,Nuclear Medicine & Medical Imaging","Nuclear Sciences & Tecnology
The TSEE response (thermally stimulated exoelectron emission) of BeO t
hin films to photon irradiations at constant H(0.07) has been determin
ed over the photon energy range from 15 keV to 1.25 MeV. The detectors
were covered with different plastic foils of an effective atomic numb
er varying between 6.7 and 9.7 and a thickness of 7 mg.cm-2 irradiated
on a 30 x 30 x 15 cm3 PMMA slab phantom. The values of H(0.07) were c
alculated from air kerma with the aid of published conversion coeffici
ents. The response curves obtained demonstrate that the BeO layer of t
he detectors behaves like a Bragg-Gray detector at photon energies abo
ve 30 keV. Between 30-40 keV the response is strongly dependent on the
composition of the cover material. At about 100 keV the low atomic nu
mber of the detector substrate causes undersensitivity.