METROLOGICAL CHARACTERISTICS OF JOSEPHSON THIN-FILM TRANSITIONS FROM YBACUO ON BICRYSTALLINE SUBSTRATES

Citation
As. Katkov et al., METROLOGICAL CHARACTERISTICS OF JOSEPHSON THIN-FILM TRANSITIONS FROM YBACUO ON BICRYSTALLINE SUBSTRATES, Pis'ma v Zurnal tehniceskoj fiziki, 19(9), 1993, pp. 70-73
Citations number
5
Categorie Soggetti
Physics, Applied
ISSN journal
03200116
Volume
19
Issue
9
Year of publication
1993
Pages
70 - 73
Database
ISI
SICI code
0320-0116(1993)19:9<70:MCOJTT>2.0.ZU;2-T