ELECTROREFLECTANCE-PHOTOREFLECTANCE TECHNIQUE FOR STUDIES OF BUILT-INELECTRIC-FIELD IN LAYERED MATERIALS

Authors
SYDOR M BADAKHSHAN A DALE DA ALAVI K PATHAK R
Citation
M. Sydor et al., ELECTROREFLECTANCE-PHOTOREFLECTANCE TECHNIQUE FOR STUDIES OF BUILT-INELECTRIC-FIELD IN LAYERED MATERIALS, Applied physics letters, 63(4), 1993, pp. 527-529
Citations number
15
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
63
Issue
4
Year of publication
1993
Pages
527 - 529
Database
ISI
SICI code
0003-6951(1993)63:4<527:ETFSOB>2.0.ZU;2-0
Abstract
We use a new modulation technique to investigate photoreflectance from layered electronic materials. The technique can be used to determine the direction of the electric field, and separate the effects of elect ric field modulation from extraneous modulations due to laser generate d charge carriers.